Author:
Lin Xijiang,Cheng Wu-Tung,Rajski Janusz
Cited by
5 articles.
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1. Using Custom Fault Models to Improve Understanding of Silicon Failures;2022 IEEE International Test Conference (ITC);2022-09
2. Enhanced DFT for Fortuitous Detection of Transition Faults During Scan Shift;2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS);2022-05-23
3. On Modeling CMOS Library Cells for Cell Internal Fault Test Pattern Generation;2021 IEEE 30th Asian Test Symposium (ATS);2021-11
4. Methodology of Generating Timing-Slack-Based Cell-Aware Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021
5. SWIFT: Switch-Level Fault Simulation on GPUs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2019-01