Author:
Geng Hao,Yang Haoyu,Yu Bei,Li Xingquan,Zeng Xuan
Cited by
11 articles.
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1. Machine Learning–Based VLSI Test and Verification;Machine Learning for VLSI Chip Design;2023-06-23
2. Bit-Level Quantization for Efficient Layout Hotspot Detection;2023 International Symposium of Electronics Design Automation (ISEDA);2023-05-08
3. Mixed-Type Wafer Failure Pattern Recognition;Proceedings of the 28th Asia and South Pacific Design Automation Conference;2023-01-16
4. Accuracy-Based Hybrid Parasitic Capacitance Extraction Using Rule-Based, Neural-Networks, and Field-Solver Methods;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-12
5. Hotspot Detection with Machine Learning Based on Pixel-Based Feature Extraction;Scientific Programming;2022-08-23