1. Logic Diagnosis with Hybrid Fail Data;ACM Transactions on Design Automation of Electronic Systems;2021-05-31
2. Fault recognition based test score for improving the accuracy of defect diagnosis;Electronics Letters;2021-04-20
3. Pass/Fail Data for Logic Diagnosis under Bounded Transparent-Scan;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021
4. New Targets for Diagnostic Test Generation;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10
5. Improving the accuracy of defect diagnosis by test score based on fault free;Electronics Letters;2020-08