Fault recognition based test score for improving the accuracy of defect diagnosis
Author:
Affiliation:
1. College of Computer Science and Technology Jilin University Changchun China
2. Key Laboratory of Symbolic Computation and Knowledge Engineering Ministry of Education Changchun China
3. College of Software Jilin University Changchun China
Funder
National Natural Science Foundation of China
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1049/ell2.12195
Reference8 articles.
1. Prabhu S.P.:Techniques for enhancing test and diagnosis of digital circuits. Virginia Tech (2015)
2. Tanwir S. et al.:Information‐theoretic and statistical methods of failure log selection for improved diagnosis. In:Proceedings of IEEE International Test Conference Anaheim CA 2015 pp.1–10
3. Pomeranz I.:OBO: An output‐by‐output scoring algorithm for fault diagnosis. In:Proceedings of IEEE Computer Society Annual Symposium on VLSI Tampa FL 2014 pp.314–319
4. Improving the Accuracy of Defect Diagnosis by Considering Fewer Tests
5. A Test Selection Procedure for Improving the Accuracy of Defect Diagnosis
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