Author:
Tanwir Sarmad,Prabhu Sarvesh,Hsiao Michael,Lingappan Loganathan
Cited by
12 articles.
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1. Gloss: Guiding Large Language Models to Answer Questions from System Logs;2024 IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER);2024-03-12
2. Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis;2023 IEEE International Test Conference (ITC);2023-10-07
3. GRAND: A Graph Neural Network Framework for Improved Diagnosis;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023
4. CNN-based Data-Model Co-Design for Efficient Test-termination Prediction;2022 IEEE European Test Symposium (ETS);2022-05-23
5. Memory-Efficient Adaptive Test Pattern Reordering for Accurate Diagnosis;2021 IEEE 39th VLSI Test Symposium (VTS);2021-04-25