A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation-Reference-Cited by-同舟云学术

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A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation

Published:2018-07 Issue: Volume: Page:
ISSN:
Container-title:2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
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Author:

Diaz-Fortuny J.,Saraza-Canflanca P.,Toro-Frias A.,Castro-Lopez R.,Martin-Martinez J.,Roca E.,Rodriguez R.,Fernandez F.V.,Nafria M.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8410988/8434559/08434867.pdf?arnumber=8434867

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Method Adopting Aging Corner to Improve the Accuracy of Device Aging Simulation Model;IEEE Transactions on Device and Materials Reliability;2023-09

2. Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology;IEEE Transactions on Device and Materials Reliability;2023-09

3. Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03

4. CMOS inverter performance degradation and its correlation with BTI, HCI and OFF state MOSFETs aging;Solid-State Electronics;2022-05

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