Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor

Author:

Deligiannis Nikolaos I.1,Cantoro Riccardo1,Faller Tobias2,Paxian Tobias2,Becker Bernd2,Reorda Matteo Sonza1

Affiliation:

1. DAUIN,Politecnico di Torino,Torino,Italy

2. University of Freiburg,Freiburg,Germany

Funder

Ministry of Education

Publisher

IEEE

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Training Large Language Models for System-Level Test Program Generation Targeting Non-functional Properties;2024 IEEE European Test Symposium (ETS);2024-05-20

2. Automating the Generation of Programs Maximizing the Repeatable Constant Switching Activity in Microprocessor Units via MaxSAT;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11

3. Self-Test Library Generation for In-Field Test of Path Delay Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11

4. Evaluating the Impact of Aging on Path-Delay Self-Test Libraries;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03

5. Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing;2023 IEEE European Test Symposium (ETS);2023-05-22

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