Surface potential at threshold in thin-film SOI MOSFET's-Reference-Cited by-同舟云学术

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Surface potential at threshold in thin-film SOI MOSFET's

Published:1993-06 Issue:6 Volume:40 Page:1129-1133
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Mazhari B.,Ioannou D.E.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx1/16/5604/00214739.pdf?arnumber=214739

Cited by 25 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Detailed comparison of threshold voltage extraction methods in FD-SOI MOSFETs;Solid-State Electronics;2023-11

3. Physics and Electrical Diagnostics of Nanoelectronic Silicon-On-Insulator Structures and Devices;2023

4. A dual gate material tunnel field effect transistor model incorporating two‐dimensional Poisson and Schrodinger wave equations;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2021-07-11

5. Coupling effects;Fully Depleted Silicon-On-insulator;2021

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