Continuous-Time Modeling and Analysis of Particle Beam Metrology
Author:
Affiliation:
1. Department of Electrical and Computer Engineering, Boston University, Boston, MA, USA
Funder
U.S. National Science Foundation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
General Medicine
Link
https://ieeexplore.ieee.org/ielam/8700143/10153947/10147322-aam.pdf
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1. Shot noise-mitigated secondary electron imaging with ion count-aided microscopy;Proceedings of the National Academy of Sciences;2024-07-25
2. Ion Count-Aided Microscopy for Quantitative, Shot Noise-Mitigated Secondary Electron Imaging;Microscopy and Microanalysis;2024-07
3. Denoising Particle Beam Micrographs With Plug-and-Play Methods;IEEE Transactions on Computational Imaging;2023
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