Denoising Particle Beam Micrographs With Plug-and-Play Methods
Author:
Affiliation:
1. Department of Electrical and Computer Engineering, Boston University, Boston, MA, USA
2. Charles Stark Draper Laboratory, Cambridge, MA, USA
Funder
Draper Fellowship
National Science Foundation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Mathematics,Computer Science Applications,Signal Processing
Link
https://ieeexplore.ieee.org/ielam/6745852/10038323/10149377-aam.pdf
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5. On the influence of the sputtering in determining the resolution of a scanning ion microscope
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