Author:
Ioannou Dimitris P.,Raghunathan Uppili S.,Brochu Dave,Divergilio Adam,Jain Vibhor,Pekarik John J.
Cited by
1 articles.
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1. Electrostatic Discharge Stress Effects on the Performance and Reliability of High Performance NPN SiGe HBTs;2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS);2023-10-16