Author:
Dolecek Lara,Qazi Masood,Shah Devavrat,Chandrakasan Anantha
Cited by
68 articles.
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1. An Efficient SRAM Yield Analysis Method using Multi -Fidelity Neural Network;2024 2nd International Symposium of Electronics Design Automation (ISEDA);2024-05-10
2. CIS: Conditional Importance Sampling for Yield Optimization of Analog and SRAM Circuits;2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC);2024-01-22
3. OPT: Optimal Proposal Transfer for Efficient Yield Optimization for Analog and SRAM Circuits;2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD);2023-10-28
4. Seeking the Yield Barrier: High-Dimensional SRAM Evaluation Through Optimal Manifold;2023 60th ACM/IEEE Design Automation Conference (DAC);2023-07-09
5. Minimum Max-Rank Method for High-Sigma Yield Analysis;2023 International Symposium of Electronics Design Automation (ISEDA);2023-05-08