Author:
Kurker C.M.,Paulos J.J.,Gyurcsik R.S.,Lu J.-C.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
20 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2017-12
2. Analog and Mixed-Signal Test;Electronic Design Automation for IC System Design, Verification, and Testing;2016-04-14
3. Test Metrics Model for Analog Test Development;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2012-07
4. Variability aware SVM macromodel based design centering of analog circuits;Analog Integrated Circuits and Signal Processing;2011-10-15
5. Estimation of Analog Parametric Test Metrics Using Copulas;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2011-09