Author:
Niggemeyer D.,Redeker M.,Otterstedt J.
Cited by
29 articles.
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1. SRAM Memory Testing Methods and Analysis;Advances in Systems Analysis, Software Engineering, and High Performance Computing;2023-12-18
2. Comparative Analysis of Open and Short Defects in Embedded SRAM Using Parasitic Extraction Method for Deep Submicron Technology;Wireless Personal Communications;2023-08-28
3. Neutron-induced effects on a self-refresh DRAM;Microelectronics Reliability;2022-01
4. Analysis of Open Defect Faults in Single 6T SRAM Cell Using R and C Parasitic Extraction Method;2021 International Conference on Disruptive Technologies for Multi-Disciplinary Research and Applications (CENTCON);2021-11-19
5. Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study;2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS);2021-06-28