Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Computer Science Applications
Reference21 articles.
1. Dekker, R., Beenker, F., & Thijssen, L. (1990). A realistic fault model and test algorithms for static random access memory. IEEE Transactions on Computer-Aided Design, 9, 567–572.
2. Manoj, S., & Pineda de Gyvez, J. (2007) Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. In Frontiers in Electronic Testing (FRET, Vol. 34). Springer.
3. Niggemeyer, D., Redeker, M., & Otterstedt, J. (1998). Integration of Non-classical Faults in Standard March Tests. In Proceedings of international workshop on memory technology, design and testing.
4. De Goor, A. J. V. (1993). Using march tests to test SRAMS. IEEE Design and test Computers, 10(1), 8–14.
5. Parvathi, M., Vasantha, N., & Satya Parasad, K. (2012). Modified march C—algorithm for embedded memory testing. International Journal of Electrical and Computer Engineering (IJECE), 2(5), 571–576.