Reliability Assessment for an In-3D-NAND Approximate Searching Solution
Author:
Affiliation:
1. Macronix International Co. Ltd.,Taiwan
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10529283/10529298/10529345.pdf?arnumber=10529345
Reference10 articles.
1. Experimental Demonstration of Non-volatile Capacitive Crossbar Array for In-memory Computing
2. A Novel Computing-in-Memory Platform Based on Hybrid Spintronic/CMOS Memory
3. Technological Design of 3D NAND-Based Compute-in-Memory Architecture for GB-Scale Deep Neural Network
4. 3D AND-Type Ferroelectric Transistors for Compute-in-Memory and the Variability Analysis
5. Two-Way Transpose Multibit 6T SRAM Computing-in-Memory Macro for Inference-Training AI Edge Chips
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