Author:
Lin Yibo,Yu Bei,Pan David Z.
Cited by
7 articles.
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1. E-RVP: An Initial Design Rule Violation Predictor Using Placement Information;2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS);2022-10-24
2. Routability-Driven Detailed Placement Using Reinforcement Learning;2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC);2022-10-03
3. Via Pillar-aware Detailed Placement;Proceedings of the 2020 International Symposium on Physical Design;2020-03-20
4. Timing Closure Problem: Review of Challenges at Advanced Process Nodes and Solutions;IETE Technical Review;2018-10-22
5. Routability-driven and fence-aware legalization for mixed-cell-height circuits;Proceedings of the 55th Annual Design Automation Conference;2018-06-24