Multiple-event-transient soft-error gate-level simulator for harsh radiation environments
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/7365563/7372693/07373147.pdf?arnumber=7373147
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Efficient Modeling of Single Event Transient Effect with Limited Peak Current: Implications for Logic Circuits;Micromachines;2024-07-05
2. Layout-based reliability analysis of openMSP430 register file under external radiations;2023 International Conference on Microelectronics (ICM);2023-12-17
3. Machine Learning-Based Soft-Error-Rate Evaluation for Large-Scale Integrated Circuits;Electronics;2023-12-12
4. Standard Verification Flow Compatible Layout-Aware Fault Injection Technique for Single Event Effects Tolerant ASIC Design;2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2019-09
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