Standard Verification Flow Compatible Layout-Aware Fault Injection Technique for Single Event Effects Tolerant ASIC Design
Author:
Affiliation:
1. Scientific Research Institute of System Analysis, Russian Academy of Sciences,Moscow,Russia,117218
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9745606/9745637/09745679.pdf?arnumber=9745679
Reference18 articles.
1. Estimating circuit fault-tolerance by means of transient-fault injection in VHDL
2. Multiple-event-transient soft-error gate-level simulator for harsh radiation environments
3. A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology
4. Alternative stan-dard cell placement strategies for single-event multiple-transient mitigation;kiddie;2014 IEEE Computer Society Annual Symposium on VLSI,0
5. A layout-aware approach to fault injection for improving failure mode prediction;bottoni;Proceedings of Workshop on Sili-con Errors in Logic-System Effects,0
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1. Design-Stage Hardening of 65-nm CMOS Standard Cells Against Multiple Events;IEEE Transactions on Nuclear Science;2021-08
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