A New Vision of the Role Played by Buffer Dopants on the Operation of AlGaN/GaN HEMTs
Author:
Affiliation:
1. Universidade de Aveiro,Instituto de Telecomunicações,Aveiro,Portugal
2. AG München,Infineon Technologies,Neubiberg,Germany
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10321701/10321765/10321794.pdf?arnumber=10321794
Reference10 articles.
1. MVSG GaN-HEMT Model: Approach to Simulate Fringing Field Capacitances, Gate Current De-biasing, and Charge Trapping Effects
2. ASM GaN: Industry Standard Model for GaN RF and Power Devices—Part-II: Modeling of Charge Trapping
3. Polarization effects, surface states, and the source of electrons in AlGaN/GaN heterostructure field effect transistors;ibbetson;Appl Phys Lett,2000
4. Charge-Based EPFL HEMT Model
5. MIT virtual source GaNFET-RF compact model for GaN HEMTs: From device physics to RF frontend circuit design and validation
Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. A Physics-Based 1-D Equivalent Circuit Model for an AlGaN/GaN HEMT;IEEE Transactions on Microwave Theory and Techniques;2024
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