Electron mobility in inversion and accumulation layers on thermally oxidized silicon surfaces-Reference-Cited by-同舟云学术

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Electron mobility in inversion and accumulation layers on thermally oxidized silicon surfaces

Published:1980-08 Issue:8 Volume:27 Page:1497-1508
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Sun S.C.,Plummer J.D.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/31805/01480856.pdf?arnumber=1480856

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