Author:
Karpovsky M.G.,van de Goor A.J.,Yarmolik V.N.
Cited by
10 articles.
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1. Universal Address Sequence Generator for Memory Built-in Self-test*;Fundamenta Informaticae;2022-12-27
2. An expert system for checking the correctness of memory systems using simulation and metamorphic testing;Expert Systems with Applications;2019-10
3. Pseudo-Exhaustive Testing Based on March Tests;Multi-run Memory Tests for Pattern Sensitive Faults;2018-07-07
4. Multi-Cell Faults;Multi-run Memory Tests for Pattern Sensitive Faults;2018-07-07
5. Basics of Functional RAM Testing;Multi-run Memory Tests for Pattern Sensitive Faults;2018-07-07