Total dose effects in conventional bipolar transistors and linear integrated circuits-Reference-Cited by-同舟云学术

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Total dose effects in conventional bipolar transistors and linear integrated circuits

Published:1994-12 Issue:6 Volume:41 Page:2427-2436
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Johnston A.H.,Swift G.M.,Rax B.G.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx1/23/7975/00340598.pdf?arnumber=340598

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