The comparison of a thin-film ZnO nanodevice with silicon-based electronic devices for diagnostic X-ray beam detection-Reference-Cited by-同舟云学术

The comparison of a thin-film ZnO nanodevice with silicon-based electronic devices for diagnostic X-ray beam detection

Published:2022-06-09 Issue:7-8 Volume:177 Page:642-654
ISSN:1042-0150
Container-title:Radiation Effects and Defects in Solids
language:en
Short-container-title:Radiation Effects and Defects in Solids

Author:

Valença Claudia P. V.¹,Gonçalves Filho Luiz C.¹²,Alves Aline N.¹,Macedo Marcelo A.³,Souza Divanizia N.³,Santos Luiz A. P.²⁴^ORCID,Santos Daniel A. A.⁵

Affiliation:

1. Federal University of Pernambuco (UFPE), Recife, Brazil

2. National Nuclear Energy Commission (CNEN/CRCN-NE), Recife, Brazil

3. Departamento de Física, Federal University of Sergipe (UFS), São Cristóvão, Brazil

4. Scients, Igarassu, Brazil

5. New York Institute of Technology, Vancouver, Canada

Funder

CNEN

CNPq

CAPES

Publisher

Informa UK Limited

Subject

Condensed Matter Physics,General Materials Science,Nuclear and High Energy Physics,Radiation

Link

https://www.tandfonline.com/doi/pdf/10.1080/10420150.2022.2073878

Reference25 articles.

1. Application of commercial MOSFET detectors forin vivodosimetry in the therapeutic x-ray range from 80 kV to 250 kV

2. Evaluation of a low-cost commercial mosfet as radiation dosimeter

3. Total dose effects in conventional bipolar transistors and linear integrated circuits

4. Electronic dosimetry in radiation therapy

5. A feasibility study of a phototransistor for the dosimetry of computerized tomography and stereotactic radiosurgery beams

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