Impact of Aging Degradation on Heavy-Ion SEU Response of 28-nm UTBB FD-SOI Technology

Author:

Mounir Mahmoud M.1ORCID,Prinzie J.1ORCID,Soderstrom D.2ORCID,Niskanen K.2ORCID,Pouget V.3ORCID,Cathelin A.4ORCID,Clerc S.4,Leroux P.1ORCID

Affiliation:

1. Department of Electrical Engineering, ADVISE Research Laboratory, KU Leuven, Leuven, Belgium

2. Department of Physics, University of Jyväskylä, Jyväskylä, Finland

3. IES, University of Montpellier, CNRS, Montpellier, France

4. STMicroelectronics, Crolles, France

Funder

RADSAGA Project through the European Union’s Horizon 2020 Research and Innovation Programme

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Aging and Soft Error Resilience in Reconfigurable CNN Accelerators Employing a Multi-Purpose On-Chip Sensor;2024 IEEE 25th Latin American Test Symposium (LATS);2024-04-09

2. Resiliency in Digital Processing Systems;2023 IEEE 33rd International Conference on Microelectronics (MIEL);2023-10-16

3. Acinonyx: A Fault-tolerant High-performance Microprocessor in 28-nm FD-SOI for Long-term Space Missions;2023 European Data Handling & Data Processing Conference (EDHPC);2023-10-02

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