Author:
Abella Jaume,Vera Xavier,Unsal Osman S.,Ergin Oguz,González Antonio,Tschanz James W.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
13 articles.
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1. Electromigration-Aware Memory Hierarchy Architecture;Journal of Low Power Electronics and Applications;2023-07-11
2. Electromigration-Aware Architecture for Modern Microprocessors;Journal of Low Power Electronics and Applications;2023-01-11
3. Workload-Aware Periodic Interconnect BIST;IEEE Design & Test;2023
4. Stress-Aware Periodic Test of Interconnects;Journal of Electronic Testing;2021-12
5. Deep Healing: Ease the BTI and EM Wearout Crisis by Activating Recovery;2017 47th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W);2017-06