Author:
Guo Xinfei,Stan Mircea R.
Cited by
5 articles.
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1. Scheduling Active and Accelerated Recovery to Combat Aging in Integrated Circuits;2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS);2022-08-07
2. Towards Everlasting Flash: Preventing Permanent Flash Cell Damage using Circadian Rhythms;2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI);2022-07
3. Design-for-Recovery Techniques for Combating Chip Aging Issues;2022 China Semiconductor Technology International Conference (CSTIC);2022-06-20
4. Reliable Processing in Flash With High Temperature;2021 IEEE International Integrated Reliability Workshop (IIRW);2021-10-04
5. Introduction to Wearout;Circadian Rhythms for Future Resilient Electronic Systems;2019-06-13