Author:
Kurita Yuichi,Kempf Roland,Iida Yoshichika,Okude Jumpei,Kaneko Makoto,Mishima Hiromu K,Tsukamoto Hidetoshi,Sugimoto Eiichiro,Katakura Seiki,Kobayashi Ken,Kiuchi Yoshiaki
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Cited by
17 articles.
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