Systematic Hardware Error Identification and Calibration for Massive Multisite Testing
Author:
Funder
Texas Instruments
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9611037/9611298/09611343.pdf?arnumber=9611343
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction;IEEE Design & Test;2023-10
2. A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing;Journal of Electronic Testing;2023-02
3. A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing;Journal of Electronic Testing;2022-12
4. Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing;2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2022-10-19
5. Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing;2022 IEEE International Test Conference (ITC);2022-09
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