Author:
Khursheed Saqib,Shi Kan,Al-Hashimi Bashir M.,Wilson Peter R.,Chakrabarty Krishnendu
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
7 articles.
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1. Differential Aging Sensor Using Subthreshold Leakage Current to Detect Recycled ICs;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-12
2. Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2018-04
3. A Cost-Effective Fault Tolerance Technique for Functional TSV in 3-D ICs;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2017-07
4. Design for Test and Diagnosis of Power Switches;Journal of Circuits, Systems and Computers;2015-12-28
5. DFT Architecture With Power-Distribution-Network Consideration for Delay-Based Power Gating Test;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2015-12