Design for Test and Diagnosis of Power Switches-Reference-Cited by-同舟云学术

Design for Test and Diagnosis of Power Switches

Published:2015-12-28 Issue:03 Volume:25 Page:1640013
ISSN:0218-1266
Container-title:Journal of Circuits, Systems and Computers
language:en
Short-container-title:J CIRCUIT SYST COMP

Author:

Valka Miroslav¹,Bosio Alberto²,Dilillo Luigi²,Girard Patrick²,Virazel Arnaud²,Debaud Philippe³,Guilhot Stephane³

Affiliation:

1. Grenoble Alpes University, TIMA Laboratory, Grenoble, France

2. Université de Montpellier, LIRMM Laboratory, Montpellier, France

3. ST-Microelectronics, Grenoble, France

Abstract

Power gating techniques have been adopted so far to reduce the static power consumption of integrated circuits (ICs). Power gating is usually implemented by means of several power switches (PSs). Manufacturing defects affecting PSs can lead to increase in the actual static power consumption and, in the worst case, they can completely isolate a functional block in the IC. Thus, efficient test and diagnosis solutions are needed. In this paper, we present a novel Design for Test and Diagnosis (DfTD) solution able to increase the test quality and diagnosis accuracy of PSs. The proposed approach has been validated through SPICE simulations on ITC’99 benchmark circuits as well as on industrial test cases.

Publisher

World Scientific Pub Co Pte Lt

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Electrical and Electronic Engineering,Hardware and Architecture

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0218126616400132

Reference6 articles.

1. Leakage current mechanisms and leakage reduction techniques in deep-submicrometer CMOS circuits

2. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

3. Delay Test for Diagnosis of Power Switches

4. Intra-Cell Defects Diagnosis