Author:
Kulkarni Jaydeep P.,Roy Kaushik
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
137 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Reliable single-ended ultra-low power GNRFETs-based 9T SRAM cell with improved read and write operations;Microelectronics Reliability;2024-02
2. A Review on Non-Volatile and Volatile Emerging Memory Technologies;Computer Memory and Data Storage;2024-01-10
3. Design and Performance Analysis of 11-T SRAM Cell with BTI Reliability;2023 2nd International Conference on Automation, Computing and Renewable Systems (ICACRS);2023-12-11
4. STTSRL: Design of Triple-Node Upset Self-Recovery Latch Based on Schmidt Trigger;Journal of Physics: Conference Series;2023-12-01
5. Efficient and High Performance Ternary SRAM;2023 International Conference on Research Methodologies in Knowledge Management, Artificial Intelligence and Telecommunication Engineering (RMKMATE);2023-11-01