Ultralow-Voltage Process-Variation-Tolerant Schmitt-Trigger-Based SRAM Design-Reference-Cited by-同舟云学术

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Ultralow-Voltage Process-Variation-Tolerant Schmitt-Trigger-Based SRAM Design

Published:2012-02 Issue:2 Volume:20 Page:319-332
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Kulkarni Jaydeep P.,Roy Kaushik

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx5/92/6129939/05704587.pdf?arnumber=5704587

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