Funder
National Science Foundation of China
Research Project from the Ministry of Science and Technology
JSPS Grant-in-Aid for Scientific Research (B)
JSPS Grant-in-Aid for Scientific Research on Innovative Area
JSPS Grant-in-Aid for the Promotions of Bilateral Joint Research Projects (Japan-Germany)
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
35 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Test Compression for Launch-on-Capture Transition Fault Testing;ACM Transactions on Design Automation of Electronic Systems;2023-11-15
2. Weighted test pattern generator (TPG) for built-in self-test (BIST);LOW RADIOACTIVITY TECHNIQUES 2022 (LRT 2022): Proceedings of the 8th International Workshop on Low Radioactivity Techniques;2023
3. A Universal BIST Approach for Virtex-Ultrascale Architecture;Computer Systems Science and Engineering;2023
4. Automatic Seed Generation for Weighted Test Pattern Generation;2022 International Conference on Augmented Intelligence and Sustainable Systems (ICAISS);2022-11-24
5. BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2022-11