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Design of Area-Efficient and Highly Reliable RHBD 10T Memory Cell for Aerospace Applications

  • Published:2018-05 Issue:5 Volume:26 Page:991-994
  • ISSN:1063-8210
  • Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • language:
  • Short-container-title:IEEE Trans. VLSI Syst.

Author:

Guo JingORCID,Zhu LeiORCID,Sun Yu,Cao Huiliang,Huang Hai,Wang Tianqi,Qi ChunhuaORCID,Zhang Rongsheng,Cao Xuebing,Xiao LiyiORCID,Mao Zhigang

Funder

National Natural Science Foundation of China

Science Foundation of North University of China

China Postdoctoral Science Foundation

Science Foundation Project of Heilongjiang Province of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

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