Fault-sensitivity analysis and reliability enhancement of analog-to-digital converters-Reference-Cited by-同舟云学术

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Fault-sensitivity analysis and reliability enhancement of analog-to-digital converters

Published:2003-10 Issue:5 Volume:11 Page:839-852
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Singh M.,Koren I.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx5/92/27663/01234403.pdf?arnumber=1234403

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