Author:
Maciel N.,C. Marques E.,A.B. Naviner L.,Cai H.,Yang J.
Funder
Télécom Paris
Fondation de Coopération Scientifique Campus Paris-Saclay
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference21 articles.
1. The emergence of spin electronics in data storage;Chappert;Nat. Mater.,2007
2. High-density NAND-like spin transfer torque memory with spin orbit torque erase operation;Wang;IEEE Electron Device Lett.,2018
3. Addressing failure and aging degradation in MRAM/meRAM-on-FDSOI integration;Cai;IEEE Trans. Circuits Syst. Regul. Pap.,2018
4. Soft errors in 10-nm-scale magnetic tunnel junctions exposed to high-energy heavy-ion radiation;Kobayashi;Jpn. J. Appl. Phys.,2017
5. Radiation-induced soft error analysis of STT-MRAM a device to circuit approach;Yang;IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.,2016
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