Author:
Alioto Massimo,Palumbo Gaetano
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
51 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Study of the Reliability for the Leakage Mitigation Methods using FinFETs;Recent Advances in Electrical & Electronic Engineering (Formerly Recent Patents on Electrical & Electronic Engineering);2023-11
2. Path-Based Delay Variation Models for Parallel-Prefix Adders;IEEE Transactions on Emerging Topics in Computing;2023-07-01
3. Reliability Analysis of FinFET Based High Performance Circuits;Electronics;2023-03-15
4. Design of Various Low Power and Highspeed Full Adder Designs using 45nm Cmos Technology;International Journal of Innovative Technology and Exploring Engineering;2022-04-30
5. A scalable high‐speed hybrid 1‐bit full adder design using XOR‐XNOR module;International Journal of Circuit Theory and Applications;2021-07-22