Assessing automotive functional safety microprocessor with ISO 26262 hardware requirements

Author:

Chang Yung-Chang,Huang Li-Ren,Liu Hsing-Chuang,Yang Chih-Jen,Chiu Ching-Te

Publisher

IEEE

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Identifying and Rectifying the Potential Faults in the Probabilistic Metric Formula in ISO 26262;2024 Annual Reliability and Maintainability Symposium (RAMS);2024-01-22

2. A Design of Fault-Tolerant Battery Monitoring IC for Electric Vehicles Complying With ISO 26262;IEEE Open Journal of Circuits and Systems;2024

3. Using STLs for Effective In-Field Test of GPUs;IEEE Design & Test;2023-04

4. Stochastic Constituents for the Probabilistic Metric of Random Hardware Failures in ISO 26262;2023 Annual Reliability and Maintainability Symposium (RAMS);2023-01-23

5. Formulas of the Probabilistic Metric for Random Hardware Failures to Resolve a Dilemma in ISO 26262;2022 Annual Reliability and Maintainability Symposium (RAMS);2022-01-24

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