Using STLs for Effective In-Field Test of GPUs-Reference-Cited by-同舟云学术

Using STLs for Effective In-Field Test of GPUs

Published:2023-04 Issue:2 Volume:40 Page:109-117
ISSN:2168-2356
Container-title:IEEE Design & Test
language:
Short-container-title:IEEE Des. Test

Author:

Rodriguez Condia Josie E.¹^ORCID,da Silva Felipe Augusto²^ORCID,Bağbaga Ahmet Çağrı²,Guerrero-Balaguera Juan-David¹^ORCID,Hamdioui Said³^ORCID,Sauer Christian²,Reorda Matteo Sonza¹^ORCID

Affiliation:

1. Politecnico di Torino, Turin, Italy

2. Cadence Design Systems, Munich, Germany

3. Delft University of Technology, Delft, The Netherlands

Funder

European Commission

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx7/6221038/10066123/09815288.pdf?arnumber=9815288

Reference12 articles.

1. On the Functional Test of Special Function Units in GPUs

2. Development Flow for On-Line Core Self-Test of Automotive Microcontrollers

3. Assessing automotive functional safety microprocessor with ISO 26262 hardware requirements

4. Testing permanent faults in pipeline registers of GPGPUs: A multi-kernel approach

5. A software-based self test of CUDA Fermi GPUs

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1. STLs for GPUs: Using High-Level Language Approaches;IEEE Design & Test;2023-08

2. RISC-V-Based Platforms for HPC: Analyzing Non-functional Properties for Future HPC and Big-Data Clusters;Lecture Notes in Computer Science;2023

3. Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters;Lecture Notes in Computer Science;2023