Formulas of the Probabilistic Metric for Random Hardware Failures to Resolve a Dilemma in ISO 26262-Reference-Cited by-同舟云学术

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Formulas of the Probabilistic Metric for Random Hardware Failures to Resolve a Dilemma in ISO 26262

Published:2022-01-24 Issue: Volume: Page:
ISSN:
Container-title:2022 Annual Reliability and Maintainability Symposium (RAMS)
language:
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Author:

Atsushi Sakurai¹

Affiliation:

1. FS Micro Corporation

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9893903/9893894/09893961.pdf?arnumber=9893961

Reference9 articles.

1. A Framework for Performing Quantitative Fault Tree Analyses for Subsystems with Periodic Repairs;sakurai;IEEE Conf 67th Reliab Maint Symp (RAMS),2021

2. Generic Equations of Probabilistic Metric for Random Hardware Failures According to ISO 26262;sakurai;IEEE Conf 66th Reliab Maint Symp (RAMS),2020

3. Early safety evaluation of design decisions in E/E architecture according to ISO 26262

4. Rapid safety evaluation of hardware architectural designs compliant with ISO 26262

5. Calculating Probability Metric for Random Hardware Failures (PMHF) in the New Version of ISO 26262 Functional Safety - Methodology and Case Studies;kleyner;The Safety of Controllers Sensors and Actuators,2020

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Identifying and Rectifying the Potential Faults in the Probabilistic Metric Formula in ISO 26262;2024 Annual Reliability and Maintainability Symposium (RAMS);2024-01-22

2. Prediction of Internal Temperature of Starter Solenoid Via PoF-Based Fault Reproduction Experiment;IEEE Transactions on Instrumentation and Measurement;2023

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