Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software
Cited by
13 articles.
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1. Harzard-Based ATPG for Improving Delay Test Quality;Journal of Electronic Testing;2015-01-11
2. Impact of Hazards on Pattern Selection for Small Delay Defects;2009 15th IEEE Pacific Rim International Symposium on Dependable Computing;2009-11
3. Enhancing Simulation Accuracy through Advanced Hazard Detection in Asynchronous Circuits;IEEE Transactions on Computers;2009-03
4. Path delay fault simulation of sequential circuits;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2000-04
5. On variable clock methods for path delay testing of sequential circuits;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;1997