A Simulator of Small-Delay Faults Caused by Resistive-Open Defects
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Publisher
IEEE
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http://xplorestaging.ieee.org/ielx5/4556006/4556007/04556036.pdf?arnumber=4556036
Cited by 26 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. The effect of resistive open faults on SRAM;AIP Conference Proceedings;2024
2. Robust Pattern Generation for Small Delay Faults Under Process Variations;2023 IEEE International Test Conference (ITC);2023-10-07
3. Identifying Resistive Open Defects in Embedded Cells under Variations;Journal of Electronic Testing;2023-02
4. Graphics Processing Unit Accelerated Small Delay Fault Simulator;Journal of Communications Technology and Electronics;2021-12
5. Resistive Open Defect Classification of Embedded Cells under Variations;2021 IEEE 22nd Latin American Test Symposium (LATS);2021-10-27
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