Power Grid Fixing for Electromigration-induced Voltage Failures
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/8931666/8942037/08942141.pdf?arnumber=8942141
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. GridNetOpt: Fast Full-Chip EM-Aware Power Grid Optimization Accelerated by Deep Neural Networks;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-05
2. Electromigration Assessment in Power Grids with Account of Redundancy and Non-Uniform Temperature Distribution;Proceedings of the 2023 International Symposium on Physical Design;2023-03-26
3. Layoutmaßnahmen zur Verbesserung der Zuverlässigkeit;Grundlagen des Layoutentwurfs elektronischer Schaltungen;2023
4. Recent Progress in Physics-Based Modeling of Electromigration in Integrated Circuit Interconnects;Micromachines;2022-05-31
5. GridNet;Proceedings of the 39th International Conference on Computer-Aided Design;2020-11-02
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