Oxide thickness variation induced threshold voltage fluctuations in decanano MOSFETs: a 3D density gradient simulation study
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science
Reference18 articles.
1. The International Technology Roadmap for Semiconductors, Semiconductor Industry Association, http://notes.sematech.org/1999_ SIA_ Roadmap.htm,1999
2. Random dopant induced threshold voltage lowering and fluctuations in sub 0.1 μ m MOSFETs: a 3D ‘atomistic’ simulation study;Asenov;IEEE Trans. Electron Devices,1998
3. 1.5 nm direct-tunnelling gate oxide Si MOSFETs;Momose;IEEE Trans. Electron Devices,1996
4. Dependence of electron channel mobility on Si–SiO2interface microroughness;Ohmi;IEEE Electron Device Lett.,1991
5. Electron and hole quantisation and their impact on deep submicron silicon p- and n-MOSFET characteristics;Jallepalli;IEEE Trans. Electron Devices,1997
Cited by 15 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Impact of Random Dipole Fluctuation-Induced Variation on Nanosheet Devices;IEEE Electron Device Letters;2023-10
2. Effect of fluoride layer thickness on the leakage current in Au/CaF2/Si(111) heterostructures;Thin Solid Films;2023-10
3. UTBB FD-SOI Variability Characterization Using Programmable Transistor Arrays;2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA);2023-07-24
4. Impact of Oxide Thickness Fluctuation for Resist- and Spacer-Defined FinFETs;2022 IEEE Latin American Electron Devices Conference (LAEDC);2022-07-04
5. Suppression of buried oxide induced variability on digital performance of GeOI pMOSFETs using substrate bias scheme;Microsystem Technologies;2019-11-28
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3