Analysis and Application of Hybrid MOSFET Structure for Low Gate Leakage
Author:
Publisher
Medwell Publications
Subject
General Engineering
Reference14 articles.
1. A 40 nm gate length n-MOSFET
2. CMOS scaling into the nanometer regime
3. CMOS design near the limit of scaling
4. Impact of gate direct tunneling current on circuit performance: a simulation study
5. Leakage current mechanisms and leakage reduction techniques in deep-submicrometer CMOS circuits
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