Impact of gate direct tunneling current on circuit performance: a simulation study-Reference-Cited by-同舟云学术

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Impact of gate direct tunneling current on circuit performance: a simulation study

Published:2001 Issue:12 Volume:48 Page:2823-2829
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Chang-Hoon Choi ,Ki-Young Nam ,Zhiping Yu ,Dutton R.W.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/21013/00974710.pdf?arnumber=974710

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