CMOS scaling into the nanometer regime

Author:

Yuan Taur ,Buchanan D.A.,Wei Chen ,Frank D.J.,Ismail K.E.,Shih-Hsien Lo ,Sai-Halasz G.A.,Viswanathan R.G.,Wann H.-J.C.,Wind S.J.,Hon-Sum Wong

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

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