Detection of Terahertz Radiation by Dense Arrays of InGaAs Transistors

Author:

Yermolayev D. M.1,Polushkin E. A.1,Shapoval S. Yu.1,Popov V. V.23,Marem’yanin K. V.4,Gavrilenko V. I.4,Maleev N. A.5,Ustinov V. M.5,Zemlyakov V. E.6,Yegorkin V. I.6,Bespalov V. A.6,Muravjov A. V.7,Rumyantsev S. L.7,Shur M. S.7

Affiliation:

1. Laboratory of Epitaxial Micro- and Nanostructures, Institute of Microelectronic Technology and High-Purity Materials, Chernogolovka, 142432, Russia

2. Laboratory of Photonics, Kotelnikov Institute of Radio Engineering and Electronics (Saratov Branch), Saratov, 410019, Russia

3. Saratov Scientific Center of the Russian Academy of Sciences, Saratov 410028, Russia

4. Department for Physics of Semiconductors, Institute for Physics of Microstructures, Nizhny Novgorod, 603950, Russia

5. Physics of Semiconductor Heterostructure, Ioffe Physical Technical Institute, St. Petersburg, 194021, Russia

6. National Research University of Electronic Technology, Zelenograd, 124498, Russia

7. Center for Broadband Data Transport Science and Technology, Rensselaer Polytechnic Institute, Troy, NY 12180-3590, USA

Abstract

Detection of terahertz radiation by GaAs transistor structures has been studied experimentally. The two types of samples under study included dense arrays of HEMTs and large-apertures detectors. Arrays consisted of parallel and series chains with asymmetric gate transistors for enhanced photoresponse on terahertz radiation. We investigated two types of wide-aperture detectors: grating gate detector, and single gate detector with bow-tie antenna. Wide-aperture detectors were symmetrical. Studies of transistor chains have shown that two essential features for this type of detector are the presence of asymmetry in the gate, and the type of connection between individual transistors themselves. Wide-aperture detectors have also been tested by narrow beams of terahertz radiation, which allows analyzing the role influence of individual parts of the detector for total sensitivity to terahertz excitation. The sensitivity and noise equivalent power of the detectors were evaluated.

Publisher

World Scientific Pub Co Pte Lt

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Electronic, Optical and Magnetic Materials

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