A measurement of epidermal thickness of fingertip skin from OCT images using convolutional neural network

Author:

Lin Yongping1ORCID,Li Dezi2,Liu Wang2,Zhong Zhaowei2,Li Zhifang2,He Youwu2,Wu Shulian2ORCID

Affiliation:

1. Fujian Provincial Key Laboratory of Optoelectronic Technology and Devices, School of Optoelectronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, P. R. China

2. Key Laboratory of Optoelectronic Science and Technology for Medicine, Ministry of Education, Fujian Provincial Key Laboratory of Photonics Technology, Fujian Provincial Engineering Technology Research Center of Photoelectric Sensing Application, College of Photonic and Electronic Engineering, Fujian Normal University, Fuzhou, Fujian 350007, P. R. China

Abstract

In this study, we proposed a method to measure the epidermal thickness (ET) of skin based on deep convolutional neural network, which was used to determine the boundaries of skin surface and the ridge portion in dermal–epidermis junction (DEJ) in cross-section optical coherence tomography (OCT) images of fingertip skin. The ET was calculated based on the row difference between the surface and the ridge top, which is determined by search the local maxima of boundary of the ridge portion. The results demonstrated that the region of ridge portion in DEJ was well determined and the ET measurement in this work can reduce the effect of the papillae valley in DEJ by 9.85%. It can be used for quantitative characterization of skin to differentiate the skin diseases.

Funder

National Natural Science Foundation of China

Fujian Provincial National Science Foundation

Fund for High-level Talents of Xiamen University of Technology

Publisher

World Scientific Pub Co Pte Lt

Subject

Biomedical Engineering,Atomic and Molecular Physics, and Optics,Medicine (miscellaneous),Electronic, Optical and Magnetic Materials

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