A MULTIANODE POSITION-SENSITIVE PROPORTIONAL COUNTER FOR IN-AIR HIGH-RESOLUTION PIXE USING A CRYSTAL SPECTROMETER
Author:
Affiliation:
1. Faculty of Engineering, Hosei University, Koganei-shi, 184-8584, Japan
2. The Institute of Physical and Chemical Research (RIKEN), Wako-shi, 351-0198, Japan
Abstract
Publisher
World Scientific Pub Co Pte Lt
Link
https://www.worldscientific.com/doi/pdf/10.1142/S0129083598000066
Reference14 articles.
1. Quantitative analysis of phosphorus in amorphous silicon using PIXE with a crystal spectrometer and PIPC
2. Chemical effects in PIXE spectra
3. HIGH RESOLUTION SOFT X-RAY SPECTROMETER FOR CHEMICAL STATE ANALYSIS BY PIXE
4. HIGH RESOLUTION PIXE USING CRYSTAL SPECTROMETER COMBINED WITH POSITION SENSITIVE DETECTORS
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1. CHEMICAL STATE ANALYSIS OF Cr AND Fe BY IN-AIR PIXE USING A CURVED CRYSTAL SPECTROMETER COMBINED WITH A POSITION-SENSITIVE PROPORTIONAL COUNTER;International Journal of PIXE;2005-01
2. Rapid chemical state analysis by a highly sensitive high-resolution PIXE system;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-05
3. DIRECT SPECIATION OF SULFUR IN MARINE SEDIMENT BY HIGH-RESOLUTION PIXE;International Journal of PIXE;2000-01
4. HIGH RESOLUTION PIXE INSTRUMENTATION SURVEY, PART IV;International Journal of PIXE;1999-01
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